NanoView-C model is Compact Type provides superior measuring performance with nano-level accuracy .in surface measurement, analysis and inspection of defects. It is also easy to use and has high measuring repeatability to give you useful information for R&D and analysis of your product
聯絡我們
公司名稱
NanoSystem Co., LTD
地址
1688-5 Shinil-Dong, Daedeok-Gu, Daejeon 306-230 KOREA
詢盤籃
幫助
ace_suppliers@hotmail.com 
604292613