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Mini SEM
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The FEG Mini SEM can operate at low voltage, where the beam energy is selectable from 500 eV to 6 keV in steps of 1 eV. It has the unique facility of being able to bias the specimen from 0 V to -6 kV in steps of –1 V. The specimen bias facilitates very low beam landing energy operation, as low as 10 eV, as well as providing a mixed magnetic and electrostatic lens system to focus the beam on to the specimen. The mixed lens configuration helps in attaining high- resolution images at very low beam landing energies.
The complete SEM system, including column, gun, pump, display, control and high tension electronics, is incorporated on to a small trolley that can fit into small elevators, wheeled through narrow doorways, or rolled on to the back of a mini-van. Moreover, each SEM system is portable, since its column, electronics box, and vacuum system can all be individually lifted and carried by hand.
FEG Mini SEMs can be taken on field trips or moved from floor to floor in large buildings. This development creates the innovative applications for SEMs, which may include schools, hospitals, and even individual amateur researchers. The whole system fits on to a trolley measuring 1000 mm in length, 600 mm in depth and 850 mm in height. The FEG Mini SEM is a high performance low voltage SEM (LVSEM), ideal for nanostructure inspection. Magnification in the high resolution mode ranges from X 5,000 to 400,000 and in low resolution mode, varies from X 1,000 to 40,000. The SEM has a Secondary Electron (SE) detector and a Back Scattered Electron (BSE) detector
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| 公司名稱 |
STAr Technologies, Inc.
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| 地址
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4F, No. 669, Sec. 4 Chung Hsing Road,ChuTung,台灣
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| 郵政編碼 |
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| 電話 |
886-3-5835178
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| 傳真 |
886-3-5835179
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| 移動電話 |
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| 電子郵箱 |

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| 網站 |
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| 聯絡人 |
Sales /
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