Semiconductor Parameter Analyzer<br>(Agilent 4155C) - B2B貿易平臺

Semiconductor Parameter Analyzer
(Agilent 4155C)

The Agilent 4155C is the next generation of the Agilent 4155B
Semiconductor Parameter Analyzer. The 4155C provides accurate
laboratory bench top parameter analyzers for advanced device
characterization. The low-current and low-voltage resolution and built-
in quasi-static CV measurement capability of the 4155C provide a
firm foundation for future expansion with other measurement
instruments.

Key Features:

The 4155C offers 4 built-in medium-power source/monitor units
(MPSMUs), 2 Voltage source units (VSUs), and 2 Voltage monitor
units (VMUs).
Develops new process technologies and evaluates material with
measurements to 10fA and 0.2uV.
Perform quasi-static capacitance measurements versus voltage
measurements.
Automatically extracts process parameters without manually
manipulating screen markers.
Measure leakage characteristics with ultra-low leakage SMUs.
Performs point-and-click measurements with graphical user
interface.
Provides graphical data analysis capabilities with a Windows
environment.
Extend application capability by expander box (41501B).