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Off-the-shelf sensors for wafer detection
(EX-Q)
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EX-Q wafer mapping sensors provide quick and reliable detection of
semiconductor wafers and slotting errors in cassettes or FOUPs.
These sensors easily detect thin and dark coated wafers of any size
and have no moving parts to result in particulate contamination.
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| 公司名稱 |
Cyberoptics Semiconductor, Inc
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| 地址
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13555 SW Millikan Way,Beaverton,OR,VIRGINIS.(US)
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| 郵政編碼 |
97005
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| 電話 |
503-4952200
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| 傳真 |
503-4952201
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| 移動電話 |
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| 電子郵箱 |
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| 網站 |
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| 聯絡人 |
/
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詢盤籃
幫助
ace_suppliers@hotmail.com 
604292613