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Founded in 2000, STAr Technologies Inc. is based in Hsinchu, Northern Taiwan with offices in Singapore, Korea and China. In STAr, we pride as being the Semiconductor Test Architects and one of the leading parametric test solution provider in Asia for all semiconductor markets.
STAr provides test intellectual properties, software and expertise to meet the present and future parametric test needs and challenges. Our major customers span across Asia in areas such as silicon/GaAs foundries, IDMs, design houses, LCD-TFT and wired/wireless components manufacturers.
With STAr’s leading edge technologies and experience, our flagship product STAr-Sagittarius IP (SagiIP) is developed to provide unmatched test solutions in parametric test areas such as device characterization, reliability qualification, flash evaluation, SPICE electrical measurements, FPD (flat-panel display) and PD/LD (photo-diode/laser-diode) production tests. In full complementary, STAr-Virgo is a complete range of high performance probe cards for DC, AC, RF and optical parametric tests. With multiple patents awarded and pending, STAr Virgo is currently the leading parametric probe card for ultra-low current, high-temperature and wide-bandwidth RF tests.
STAr’s continuous innovation to maintain technological leadership, strong customer relationship and industrial partnership has lead to whole new revolutionary experience in semiconductor tests for increased productivity, reduced cost-of-test and unparalleled time-to-market.
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成立年份: |
2000
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| 公司名稱 |
思達科技股份有限公司
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| 地址
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台灣HsinChu4F, No. 669, Sec. 4 Chung Hsing Road,ChuTung
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| 電話 |
886-3-583
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886-3-583
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| 聯絡人 |
劉俊良 /
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